@article{Nielsen_2019, title={Multilayer Reflection Tomography from Monte Carlo Simulations}, volume={2}, url={https://tidsskrift.dk/nanovidenskabKU/article/view/111792}, abstractNote={<p>X-ray Reflection Tomography (XRT) is a tool for imaging of buried layers and interfaces in multilayer thin-films. The<br>method combines X-ray reflectivity and computerized tomography to determine spatially dependent reflectivity curves.<br>Simulations of X-ray reflection tomography experiments make it possible to asses to which accuracy properties can be determined<br>and evaluate various reconstruction methods.2 It is thus important that such simulations mimic real experiments.<br>In this paper it is shown that a Monte Carlo approach can be used to simulate XRT experiments and test reconstruction<br>techniques. This approach takes into account the statistical properties of an experimental X-ray setup and allows for<br>simulation of diverse experimental configurations. The currently used analytical simulations based on projections do not<br>include such statistics and are limited in scope. The Monte Carlo approach will facilitate further development of the<br>applications of XRT.</p>}, journal={UCPH NanoScience - a student research journal}, author={Nielsen, Rasmus Buus}, year={2019}, month={Jan.} }