KIM, J.- taek; YI, K.; DANVY, O. Assessing the Overhead of ML Exceptions by Selective CPS Transformation. BRICS Report Series, [S. l.], v. 5, n. 15, 1998. DOI: 10.7146/brics.v5i15.19287. Disponível em: https://tidsskrift.dk/brics/article/view/19287. Acesso em: 23 apr. 2024.